Applications and Metrology at Nanometer Scale 2


Measurement Systems, Quantum Engineering and RBDO Method


Volume 10 - Reliability of Multiphysical Systems SET Coordinated by Abdelkhalak El Hami

Applications and Metrology at Nanometer Scale 2

Edited by

Pierre Richard Dahoo, University of Versailles Saint-Quentin, France
Philippe Pougnet, Universities of Grenoble Alpes and Grenoble INP, France
Abdelkhalak El Hami, Institut National des Sciences Appliquées (INSA-Rouen Normandie), France


ISBN : 9781786306876

Publication Date : February 2021

Hardcover 274 pp

165.00 USD

Co-publisher

Description


Nanoscience, nanotechnologies and the laws of quantum physics are sources of disruptive innovation that open up new fields of application. Quantum engineering enables the development of very sensitive materials, sensor measurement systems and computers. Quantum computing, which is based on two-level systems, makes it possible to manufacture computers with high computational power.

This book provides essential knowledge and culminates with an industrial application of quantum engineering and nanotechnologies. It presents optical systems for measuring at the nanoscale, as well as quantum physics models that describe how a two-state system interacts with its environment. The concept of spin and its derivation from the Dirac equation is also explored, while theoretical foundations and example applications aid in understanding how a quantum gate works. Application of the reliability-based design optimization (RBDO) method of mechanical structures is implemented, in order to ensure reliability of estimates from the measurement of mechanical properties of carbon nanotube structures.

This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master’s students.

Contents


1. Measurement Systems Using Polarized Light.
2. Quantum-scale Interaction.
3. Quantum Optics and Quantum Computers.
4. Reliability-based Design Optimization of Structures.

About the authors


Pierre Richard Dahoo is Professor and Holder of the Chair of Materials Simulation and Engineering at the University of Versailles Saint-Quentin in France. He is Director of Institut des Sciences et Techniques des Yvelines and a specialist in modeling and spectroscopy at the LATMOS laboratory of the CNRS.

Philippe Pougnet is a former expert in reliability and the technology-product-process of embedded mechatronic systems. He graduated from Université Grenoble Alpes and Grenoble INP in France.

Abdelkhalak El Hami is Professor at the Institut National des Sciences Appliquées (INSA-Rouen Normandie) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics, as well as several European pedagogical projects.